CMOS Image Sensor Random Telegraph Noise Time Constant Extraction From Correlated To Uncorrelated Double Sampling
نویسندگان
چکیده
منابع مشابه
Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method †
A study of the random telegraph noise (RTN) of a 1.1 μm pitch, 8.3 Mpixel CMOS image sensor (CIS) fabricated in a 45 nm backside-illumination (BSI) technology is presented in this paper. A noise decomposition scheme is used to pinpoint the noise source. The long tail of the random noise (RN) distribution is directly linked to the RTN from the pixel source follower (SF). The full 8.3 Mpixels are...
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Logic Delay Uncertainty Takashi Matsumoto Department of Communications and Computer Engineering Kyoto University, Kyoto, Japan Email: [email protected] Kazutoshi Kobayashi Department of Electronics Kyoto Institute of Technology, Kyoto, Japan Hidetoshi Onodera Department of Communications and Computer Engineering Kyoto University, Kyoto, Japan Abstract—Statistical nature of RTN-...
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ژورنال
عنوان ژورنال: IEEE Journal of the Electron Devices Society
سال: 2017
ISSN: 2168-6734
DOI: 10.1109/jeds.2016.2623799